0.25
0.5
0.75
1.25
1.5
1.75
2
Scanning Transmission Electron Microscopy: Applications in Materials Science
Published on Dec 18, 20135596 Views
Various Scanning Transmission Electron Microscopy (STEM) imaging techniques (ADF, HAADF, ABF) have become extremely useful for materials characterization at the nano- and atomic scale, particularly du
Related categories
Chapter list
Scanning transmission electron microscopy (STEM): Applications in Materials Science00:00
Outline - 102:00
1 TEM vs STEM03:05
STEM Basics - 103:51
2. Signals in STEM04:15
STEM Basics - 204:44
3. detectors ADF, HAADF05:40
Annular Field Bright (ABF)06:36
4. Lens Aberrations07:13
STEM Basics - 307:30
Some names of aberrations08:06
Spherical Aberration08:42
STEM Basics - 409:24
5. Aberration correctors 10:06
Probe Corrector10:23
Cs Corrected beam profile10:56
6. Ronchigram11:26
Focusing with the Ronchigram11:49
The Electron Ronchigram in Cs corrected STEM12:15
Outline - 212:46
1. Microscopes for STEM imaging13:00
Experimental STEM13:25
2. Probe semi-angle (α) determination13:45
3. ADF, HAADF, ABF detector acceptance angles determination14:11
Experimetally determined values14:33
4. Specimen thickness14:39
5. Collection angles15:29
6. Processing of STEM images16:04
Processing of distortion free HR HAADF-STEM images17:02
IMAGE-WARP procedure17:18
7 Specimens for STEM/TEM observation18:24
Amorphous layer20:02
Outline - 320:34
1. Qualitative interpretation of HAADF-STEM images20:40
2. Quantitative HAADF-STEM21:46
Diffraction pattern22:37
Software for STEM image calculations23:12
3. Input structure data quality23:39
Comparison of different calculation procedures24:38
Defocus25:19
Outline - 425:34
1. AI-doped ZnO thin films26:08
Bright-field and high-angle STEM images of ZnO:AI26:40
2. Strained AIGaN/GaN superlattice27:11
Experimental bright-field STEM image27:49
Experimental HAADF-STEM imageof the SLS region28:21
Experimental HAADF-STEM image of the SLS cladding layer28:59
Average filtering of the experimental HAADF-STEM image of the SLS29:24
HAADF-STEM analysis-Results-Thickness determination29:39
3. 3 KTiO2(OH) channel structures29:58
4. CaTiO330:38
Defocus-thickness map - 131:38
Defocus-thickness map - 232:12
5. La(Ti,Mg)O3 - CaTiO3 solid solutions33:37
In thin region differences34:02
6. In2O3 - doped ZnO34:35
HRTEM of IB's35:32
HAADF of IB's - 136:04
HAADF of IB's - 236:50
HAADF vs ADF37:11
EDXS37:59
EDXS line profile38:38
7 SrONb2O - doped SrTiO3 thermoelectrics39:06
Two Sr(Ti Nb) O3 grains39:58
Single SrO planar faults40:24
HRTEM of RP faults40:36
HRSTEM of RP faults41:05
Ti, Nb, Sr41:27
X-ray mappings - 141:55
X-ray mappings - 243:03
8. Sr - hexaaluminate44:17
Experimental and Noise Filtered45:15
According to the Structures45:30
Conclusions46:25
Acknowledgements48:13