Scanning Transmission Electron Microscopy: Applications in Materials Science

Published on 2013-12-185597 Views

Various Scanning Transmission Electron Microscopy (STEM) imaging techniques (ADF, HAADF, ABF) have become extremely useful for materials characterization at the nano- and atomic scale, particularly du

Kolokviji na Institutu "Jožef Stefan"

Presentation

Scanning transmission electron microscopy (STEM): Applications in Materials Science00:00

Outline - 133:24:44

1 TEM vs STEM51:26:49

STEM Basics - 164:22:34

2. Signals in STEM70:54:40

STEM Basics - 279:09:35

3. detectors ADF, HAADF94:36:04

Annular Field Bright (ABF)110:03:33

4. Lens Aberrations120:21:27

STEM Basics - 3125:08:39

Some names of aberrations135:03:57

Spherical Aberration145:05:48

STEM Basics - 4156:50:51

5. Aberration correctors 168:24:39

Probe Corrector173:18:40

Cs Corrected beam profile182:21:02

6. Ronchigram190:48:32

Focusing with the Ronchigram196:58:23

The Electron Ronchigram in Cs corrected STEM204:25:41

1. Microscopes for STEM imaging216:53:06

Experimental STEM223:45:54

2. Probe semi-angle (α) determination229:23:22

3. ADF, HAADF, ABF detector acceptance angles determination236:26:52

Experimetally determined values242:30:58

4. Specimen thickness244:23:30

5. Collection angles258:12:47

6. Processing of STEM images267:47:57

Processing of distortion free HR HAADF-STEM images283:59:35

IMAGE-WARP procedure288:26:26

7 Specimens for STEM/TEM observation306:53:05

Amorphous layer334:04:43

1. Qualitative interpretation of HAADF-STEM images344:28:43

2. Quantitative HAADF-STEM363:03:16

Diffraction pattern377:04:36

Software for STEM image calculations386:48:33

3. Input structure data quality394:18:53

Comparison of different calculation procedures410:48:42

Defocus422:08:11

1. AI-doped ZnO thin films435:36:47

Bright-field and high-angle STEM images of ZnO:AI444:32:14

2. Strained AIGaN/GaN superlattice453:08:48

Experimental bright-field STEM image463:50:34

Experimental HAADF-STEM imageof the SLS region472:42:38

Experimental HAADF-STEM image of the SLS cladding layer483:18:53

Average filtering of the experimental HAADF-STEM image of the SLS490:07:17

HAADF-STEM analysis-Results-Thickness determination494:26:09

3. 3 KTiO2(OH) channel structures499:37:06

4. CaTiO3510:35:48

Defocus-thickness map - 1527:14:30

Defocus-thickness map - 2536:48:16

5. La(Ti,Mg)O3 - CaTiO3 solid solutions560:24:33

In thin region differences567:26:02

6. In2O3 - doped ZnO576:30:21

HRTEM of IB's592:14:05

HAADF of IB's - 1601:11:52

HAADF of IB's - 2614:09:01

HAADF vs ADF619:45:30

EDXS633:16:21

EDXS line profile643:58:59

7 SrONb2O - doped SrTiO3 thermoelectrics651:54:12

Two Sr(Ti Nb) O3 grains666:21:43

Single SrO planar faults673:23:21

HRTEM of RP faults676:55:06

HRSTEM of RP faults684:53:02

Ti, Nb, Sr691:03:49

X-ray mappings - 1698:50:47

X-ray mappings - 2717:38:29

8. Sr - hexaaluminate738:17:55

Experimental and Noise Filtered754:22:26

According to the Structures758:31:10

Conclusions773:38:19

Acknowledgements803:40:02